ChroZen GC/MS

ChroZen GC/MS is an innovative single quadruple mass spectrometer to carry out qualitative and quantitative analysis for unknown or complex samples in trace level. With its extraordinary ultra-inert ion source, UEIS (Ultra Efficiency Ion Source), it optimizes the ionization and ion beam focusing to ensure both ideal repeatability and sensitivity, and efficiently works for toxicology, food safety and geochemical applications, where samples can be polluted higher. The large capacity of standard vacuum pump (240L/s) stabilizes the system faster and 300L/s of vacuum pump is also available optionally. It also provides the widest mass range (1.4~1,200 amu) as well as very low instrument detection limit (less than 10 fg of OFN).

Innovation Creates Greater Efficiency

The newly designed innovative ion source, UEIS (Ultra Efficiency Ion Source), effectively prevents ion source
contamination, thus, there are more ionized molecules transferred to the detector to give superior sensitivity and
the detector lifetime gets extended. The individually connected double filaments and structural modification of
ion source make the maintenance cost less expensive and more efficient.

Main Features

More Than Sensitivity

▪ UEIS (Ultra Efficiency Ion Source) with each enhanced part such as lens and pre-filters to maximize efficiency of ionization for superior sensitivity
▪ EM (Electron Multiplier): Six spiral multiplier channels to increase linear output current for excellent sensitivity
(SNR 2,500:1, IDL < 10 fg)

More Than Performance

▪ Wide mass range: 1.4~ 1,200 amu
▪ Rapid scan speed: Up to 20,000 amu/s

More Than Reliability

▪ High capacity of turbo pump: 240L/s of standard vacuum system for fast stabilization
▪ Double filaments: Uninterruptible and stable analysis to minimize instrument downtime
▪ Ultra-inert ion source, pre-filter and quadrupole to reduce contaminations

More Than Variety

▪ EI as standard and CI (PCI & NCI) as option
▪ Scan, SIM, Simultaneous Scan/SIM mode
▪ Various library support depending on application